S. Kim, M. Faerevaag, M. Jung, S. Jung, D. Oh, J. Lee, and S. K. Cha, Testing intermediate representations for binary analysis, in Proceedings of the 32nd IEEE/ACM International Conference on Automated Software Engineering, pp. 353–364, IEEE Press, 2017.
S. Kim, M. Faerevaag, M. Jung, S. Jung, D. Oh, J. Lee, and S. K. Cha, Testing intermediate representations for binary analysis, in Proceedings of the 32nd IEEE/ACM International Conference on Automated Software Engineering, pp. 353–364, IEEE Press, 2017.